Publication:

Reliability of p-GaN Gate HEMTs in Reverse Conduction

Date

2021

Journal article

https://doi.org/10.1109/ted.2020.3042134

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Author(s)

;

;

Bakeroot, Benoit

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Amirifar, Nooshin

;

;

Jacobs, Kristof J.P.

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;

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Groeseneken, Guido

;

Decoutere, Stefaan

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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Acq. date: 2026-10-12