Publication:
GaN power IC design using the MIT virtual source GaNFET compact model with gate leakage and V-T instability effect
Loading...
Journal
Abstract
Description
Statistics
Views
1977 since deposited on 2022-02-25
2last month
1last week
Acq. date: 2026-05-02
Citations
Statistics
Views
1977 since deposited on 2022-02-25
2last month
1last week
Acq. date: 2026-05-02
Citations