Publication:

Process-induced charging damage in IGZO nTFTs

Date

2021

Proceedings Paper

https://doi.org/10.1109/IRPS46558.2021.9405201

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Author(s)

Hiblot, Gaspard

;

Rassoul, Nouredine

;

;

Devriendt, Katia

;

Vaisman Chasin, Adrian

;

van Setten, Michiel

;

Belmonte, Attilio

;

Delhougne, Romain

;

Kar, Gouri Sankar

Journal

na

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Acq. date: 2026-02-25