Browsing Conference contributions by author "Fadida, Sivan"

Now showing items 1-2 of 2

Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors

Fadida, Sivan; Palumbo, F; Nyns, Laura; Lin, Dennis; Van Elshocht, Sven; Caymax, Matty; Eizenberg, Moshe (2013)
Ti as a reactive gate electrode on high-k/p-Ge MOS capacitors

Fadida, Sivan; Nyns, Laura; Lin, Dennis; Van Elshocht, Sven; Caymax, Matty; Eizenberg, Moshe (2014)