Browsing Conference contributions by author "Caillat, Christian"
Now showing items 1-15 of 15
-
A new high-k/metal gate CMOS integration scheme (Diffusion and Gate Replacement) suppressing gate height asymmetry and compatible with high-thermal budget memory technologies
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Cho, Moon Ju; Simoen, Eddy; Aoulaiche, Marc; Albert, Johan; Chew, Soon Aik; Noh, Kyung Bong; Son, Yunik; Fazan, Pierre; Horiguchi, Naoto; Thean, Aaron (2014) -
Effect of interface states on 1T-FBRAM cell retention
Aoulaiche, Marc; Collaert, Nadine; Blomme, Pieter; Simoen, Eddy; Altimime, Laith; Groeseneken, Guido; Jurczak, Gosia; Mendes Almeida, Luciano; Caillat, Christian; Mahatme, N.N. (2012) -
Floating body retention analysis for 1T-DRAM
Aoulaiche, Marc; Simoen, Eddy; Witters, Liesbeth; Claeys, Cor; Jurczak, Gosia; Nicoletti, Talitha; dos Santos, Sara; Martino, Jao Martino; Caillat, Christian; Fazan, Pierre (2013) -
I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration
Ritzenthaler, Romain; Schram, Tom; Cho, Moon Ju; Mocuta, Anda; Horiguchi, Naoto; Thean, Aaron; Spessot, Alessio; Caillat, Christian; Aoulaiche, Marc; Fazan, Pierre; Noh, Kyung Bong; Son, Yunik (2015) -
Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors
Aoulaiche, Marc; Federico, Antonio; Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Arimura, Hiroaki; Cho, Moon Ju; Kauerauf, Thomas; Crupi, Felice; Spessot, Alessio; Caillat, Christian; Fazan, Pierre; Na, Hoon Joo; Son, Yunik; Noh, Kyung Bong; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron (2013) -
Impact of DRAM process flow on the performance of periphery devices for next generation mobile applications
Spessot, Alessio; Caillat, Christian; Srividya, Vidya; Fazan, Pierre; Schram, Tom; Mitard, Jerome (2011) -
Impact of generation centers on the retention time in 1T-FBRAM
Aoulaiche, Marc; Caillat, Christian; Simoen, Eddy; Groeseneken, Guido; Jurczak, Gosia (2012) -
Insights in low frequency noise of advanced and high-mobility channel transistors
Simoen, Eddy; Romeo, Tomasso; Luque Rodriguez, Abraham; Jimenez Tejada, Juan Antonio; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Mitard, Jerome; Caillat, Christian; Fazan, Pierre; Crupi, Felice; Claeys, Cor (2012) -
Low-power DRAM-compatible replacement gate high-k/metal gate stacks
Ritzenthaler, Romain; Schram, Tom; Bury, Erik; Mitard, Jerome; Ragnarsson, Lars-Ake; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron; Spessot, Alessio; Caillat, Christian; Srividya, Vidya; Fazan, Pierre (2012) -
Ni(Pt) silicide with improved thermal stability for application in DRAM PERI or RMG devices
Schram, Tom; Spessot, Alessio; Ritzenthaler, Romain; Rosseel, Erik; Caillat, Christian; Horiguchi, Naoto; Fazan, Pierre (2013) -
On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs
Simoen, Eddy; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Claeys, Cor; Mendes Almeida, Luciano; Andrada, Gloria; Luque Rodrigues, Abraham; Jimenez Tejada, Juan Antonio; Caillat, Christian; Fazan, Pierre (2012) -
On the variability of the low-frequency noise in UTBOX SOI nMOSFETs
Simoen, Eddy; Andrade, G.M.C.; Mendes Almeida, Luciano; Aoulaiche, Marc; Caillat, Christian; Jurczak, Gosia; Claeys, Cor (2012) -
Optimized process simulation of USJ for HKMG DRAM periphery transistors
Spessot, Alessio; Caillat, Christian; Ritzenthaler, Romain; Schram, Tom; Fazan, Pierre (2014) -
Thermal budget impact on HKMG Al2O3 and La-based stacks for 2x DRAM periphery transistors
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Na, Hoon Jo; Lee, Sun Ghil; Son, Yunik; Noh, Kyung Bong; Aoulaiche, Marc; Arimura, Hiroaki; Horiguchi, Naoto; Fazan, Pierre; Thean, Aaron (2014) -
Understanding workfunction tuning in HKMG by Lanthanum diffusion combining simulations and measurements
Spessot, Alessio; Caillat, Christian; Fazan, Pierre; Ritzenthaler, Romain; Schram, Tom (2013)