Browsing Conference contributions by author "Iannacone, G."

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A model for MOS gate stack quality evaluation based on the gate current 1/f noise

Magnone, P.; Crupi, F.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008)
Modeling the gate current 1/f noise and its application to advanced CMOS devices

Crupi, F.; Magnone, P.; Iannacone, G.; Giusi, G.; Pace, C.; Simoen, Eddy; Claeys, Cor (2008)