Publication:
Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO4
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1749 since deposited on 2022-06-23
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Acq. date: 2026-01-11
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1749 since deposited on 2022-06-23
1last month
1last week
Acq. date: 2026-01-11
Citations