Publication:

Understanding and modelling the PBTI reliability of thin-film IGZO transistors

Date

2021
Proceedings Paper
https://doi.org/10.1109/IEDM19574.2021.9720666
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Author(s)

Vaisman Chasin, Adrian  
;
Franco, Jacopo  
;
Triantopoulos, Konstantinos  
;
Dekkers, Harold  
;
Rassoul, Nouredine  
;
Belmonte, Attilio  
;
Smets, Quentin  
;
Subhechha, Subhali  
;
Claes, Dieter  
;
van Setten, Michiel  
;
Mitard, Jerome  
;
Delhougne, Romain  
;
Afanasiev, Valeri  
;
Kaczer, Ben  
;
Kar, Gouri Sankar  

Journal

na

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1948 since deposited on 2022-07-09
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1948 since deposited on 2022-07-09
4last month
Acq. date: 2026-01-07

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