Publication:

Understanding and modelling the PBTI reliability of thin-film IGZO transistors

Date

2021

Proceedings Paper

https://doi.org/10.1109/IEDM19574.2021.9720666

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Author(s)

Vaisman Chasin, Adrian

;

;

Triantopoulos, Konstantinos

;

Dekkers, Harold

;

Rassoul, Nouredine

;

Belmonte, Attilio

;

;

Subhechha, Subhali

;

;

van Setten, Michiel

;

;

Delhougne, Romain

;

Afanasiev, Valeri

;

;

Kar, Gouri Sankar

Journal

na

Statistics

1953 since deposited on 2022-07-09

Acq. date: 2026-02-26