dc.contributor.author | Eyben, Pierre | |
dc.contributor.author | Arutchelvan, Goutham | |
dc.contributor.author | Chiarella, Thomas | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Ritzenthaler, Romain | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Dentoni Litta, Eugenio | |
dc.contributor.author | Horiguchi, Naoto | |
dc.contributor.author | Goux, Ludovic | |
dc.date.accessioned | 2024-01-18T09:29:24Z | |
dc.date.available | 2022-08-10T10:31:41Z | |
dc.date.available | 2024-01-18T09:29:24Z | |
dc.date.issued | 2022-09 | |
dc.identifier.issn | N/A | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/40240.2 | |
dc.title | Investigation of access resistance components in Si-channel p-FinFET using cascaded devices. | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Eyben, Pierre | |
dc.contributor.imecauthor | Arutchelvan, Goutham | |
dc.contributor.imecauthor | Chiarella, Thomas | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Ritzenthaler, Romain | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Dentoni Litta, Eugenio | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.orcidimec | Eyben, Pierre::0000-0003-3686-556X | |
dc.contributor.orcidimec | Chiarella, Thomas::0000-0002-6155-9030 | |
dc.contributor.orcidimec | Ritzenthaler, Romain::0000-0002-8615-3272 | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Dentoni Litta, Eugenio::0000-0003-0333-376X | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.contributor.orcidimec | Arimura, Hiroaki::0000-0002-3138-708X | |
dc.date.embargo | 9999-12-31 | |
dc.source.numberofpages | 2 | |
dc.source.peerreview | yes | |
dc.source.conference | Solid State Devices and Materials - SSDM 2022 | |
dc.source.conferencedate | 26/09/2022 | |
dc.source.conferencelocation | Chiba - Japan | |
dc.source.journal | N/A | |
imec.availability | Published - imec | |