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Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.
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Authors
Eyben, Pierre
;
Arutchelvan, Goutham
;
Chiarella, Thomas
;
Arimura, Hiroaki
;
Ritzenthaler, Romain
;
Mitard, Jerome
;
Dentoni Litta, Eugenio
;
Horiguchi, Naoto
;
Goux, Ludovic
ISSN
N/A
Conference
Solid State Devices and Materials - SSDM 2022
Journal
N/A
Title
Investigation of access resistance components in Si-channel p-FinFET using cascaded devices.
Publication type
Meeting abstract
Embargo date
9999-12-31
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2
20.500.12860/40240.2
*
2024-01-18T09:26:49Z
validation by library/open access desk
1
20.500.12860/40240
2022-08-10T10:31:41Z
*Selected version
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