Publication:
Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling study
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2017 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-10
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Metrics
Views
2017 since deposited on 2021-10-14
1last month
Acq. date: 2026-01-10
Citations