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Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling study
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Authors
Wu, Ming Fang
;
Vantomme, Andre
;
Hogg, S. M.
;
Langouche, G.
;
Van der Stricht, Wim
;
Jacobs, Koen
;
Moerman, Ingrid
Issue
3
Journal
Appl. Phys. Lett.
Volume
74
Title
Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling study
Publication type
Journal article
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