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Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling study
Publication:
Elastic strain in In0.18Ga0.82N layer: a combined x-ray diffraction and Rutherford backscattering/channeling study
Date
1999
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Ming Fang
;
Vantomme, Andre
;
Hogg, S. M.
;
Langouche, G.
;
Van der Stricht, Wim
;
Jacobs, Koen
;
Moerman, Ingrid
Journal
Appl. Phys. Lett.
Abstract
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2015
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
2015
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations