Publication:

Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies

Date

2021

Proceedings Paper

https://doi.org/10.1109/ICICDT51558.2021.9626482

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Author(s)

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Arimura, Hiroaki

;

de Marneffe, Jean-Francois

;

Vandooren, Anne

;

Ragnarsson, Lars-Ake

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;

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Dentoni Litta, Eugenio

;

Horiguchi, Naoto

;

;

Linten, Dimitri

;

;

Journal

na

Metrics

1479 since deposited on 2022-09-19

Acq. date: 2026-01-06