Publication:

The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs

Date

2022
Journal article
https://doi.org/10.1109/LED.2022.3206610
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Accepted version 787.69 KB

Author(s)

Millesimo, M.
;
Borga, Matteo  
;
Bakeroot, Benoit  
;
Posthuma, Niels  
;
Decoutere, Stefaan  
;
Sangiorgi, E.
;
Fiegna, C.
;
Tallarico, A. N.

Journal

IEEE ELECTRON DEVICE LETTERS

Abstract

Description

Metrics

Downloads

301 since deposited on 2022-11-14
24last month
1last week
Acq. date: 2026-01-07

Views

1528 since deposited on 2022-11-14
Acq. date: 2026-01-07

Citations

Metrics

Downloads

301 since deposited on 2022-11-14
24last month
1last week
Acq. date: 2026-01-07

Views

1528 since deposited on 2022-11-14
Acq. date: 2026-01-07

Citations