The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs

Millesimo, M.; Borga, Matteo; Bakeroot, Benoit; Posthuma, Niels; Decoutere, Stefaan; Sangiorgi, E.; Fiegna, C.; Tallarico, A. N.

doi:10.1109/led.2022.3206610

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The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs

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2022

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https://doi.org/10.1109/led.2022.3206610

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IEEE ELECTRON DEVICE LETTERS

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The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs

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