Publication:

Impact of doping and geometry on breakdown voltage of semi-vertical GaN-on-Si MOS capacitors

Date

2022

Journal article

https://doi.org/10.1016/j.microrel.2022.114620

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Author(s)

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Chatterjee, Urmimala

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Bakeroot, Benoit

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Decoutere, Stefaan

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Journal

MICROELECTRONICS RELIABILITY

Statistics

1231 since deposited on 2023-01-09

Acq. date: 2026-02-25