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Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress
Publication:
Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress
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Date
2022
Proceedings Paper
https://doi.org/10.1109/IRPS48227.2022.9764540
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lee, Kookjin
;
Kaczer, Ben
;
Kruv, Anastasiia
;
Gonzalez, Mario
;
Eneman, Geert
;
Okudur, Oguzhan Orkut
;
Grill, Alexander
;
Franco, Jacopo
;
Vici, Andrea
;
Degraeve, Robin
;
De Wolf, Ingrid
Journal
na
Abstract
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1238
since deposited on 2023-02-27
Acq. date: 2025-12-16
Citations
Metrics
Views
1238
since deposited on 2023-02-27
Acq. date: 2025-12-16
Citations