Publication:
Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
Loading...
Journal
Abstract
Description
Statistics
Downloads
1370 since deposited on 2023-03-25
250last month
47last week
Acq. date: 2026-08-09
Views
902 since deposited on 2023-03-25
6last month
1last week
Acq. date: 2026-08-09
Citations
Statistics
Downloads
1370 since deposited on 2023-03-25
250last month
47last week
Acq. date: 2026-08-09
Views
902 since deposited on 2023-03-25
6last month
1last week
Acq. date: 2026-08-09
Citations