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Gate MOSCAP Studies on Electroless Deposited Nickel Boron as Word Line Candidate Metal for Future Scaled 3-D NAND Flash
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Authors
Ramesh, Siva
;
Rachidi, Sana
;
Donadio, Gabriele Luca
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
DOI
10.1149/2162-8777/accb66
ISSN
2162-8769
Issue
4
Journal
ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY
Volume
12
Title
Gate MOSCAP Studies on Electroless Deposited Nickel Boron as Word Line Candidate Metal for Future Scaled 3-D NAND Flash
Publication type
Journal article
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2
20.500.12860/41565.2
*
2023-07-07T08:21:47Z
validation by library/open access desk
1
20.500.12860/41565
2023-05-04T19:59:26Z
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