dc.contributor.author | Holzmeier, Fabian | |
dc.contributor.author | Dorney, Kevin | |
dc.contributor.author | Witting Larsen, Esben | |
dc.contributor.author | Nuytten, Thomas | |
dc.contributor.author | Singh, Dhirendra | |
dc.contributor.author | van Setten, Michiel | |
dc.contributor.author | Vanelderen, Pieter | |
dc.contributor.author | Bargsten, Clayton | |
dc.contributor.author | Cousin, Seth | |
dc.contributor.author | Raymondson, Daisy | |
dc.contributor.author | Rinard, Eric | |
dc.contributor.author | Ward, Rod | |
dc.contributor.author | Kapteyn, Henry | |
dc.contributor.author | Bottcher, Stefan | |
dc.contributor.author | Dyachenko, Oleksiy | |
dc.contributor.author | Kremzow, Raimund | |
dc.contributor.author | Wietstruk, Marko | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | van der Heide, Paul | |
dc.contributor.author | Petersen, John | |
dc.date.accessioned | 2023-12-04T10:20:50Z | |
dc.date.available | 2023-06-13T20:51:05Z | |
dc.date.available | 2023-12-04T10:20:50Z | |
dc.date.issued | 2021-02-22 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41731.2 | |
dc.title | Introduction to imec's AttoLab for ultrafast kinetics of EUV exposure processes and ultra-small pitch lithography | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Holzmeier, Fabian | |
dc.contributor.imecauthor | Dorney, Kevin | |
dc.contributor.imecauthor | Witting Larsen, Esben | |
dc.contributor.imecauthor | Nuytten, Thomas | |
dc.contributor.imecauthor | Singh, Dhirendra | |
dc.contributor.imecauthor | van Setten, Michiel | |
dc.contributor.imecauthor | Vanelderen, Pieter | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | van der Heide, Paul | |
dc.contributor.imecauthor | Petersen, John | |
dc.contributor.orcidimec | Holzmeier, Fabian::0000-0001-8749-5330 | |
dc.contributor.orcidimec | Dorney, Kevin::0000-0003-2097-6994 | |
dc.contributor.orcidimec | Witting Larsen, Esben::0000-0002-6294-0896 | |
dc.contributor.orcidimec | Nuytten, Thomas::0000-0002-5921-6928 | |
dc.contributor.orcidimec | Singh, Dhirendra::0000-0002-8855-0597 | |
dc.contributor.orcidimec | van Setten, Michiel::0000-0003-0557-5260 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | van der Heide, Paul::0000-0001-6292-0329 | |
dc.contributor.orcidimec | Petersen, John::0000-0003-4815-3770 | |
dc.identifier.doi | https://doi.org/10.1117/12.2595038 | |
dc.source.peerreview | no | |
dc.source.conference | SPIE Advanced Lithography 2021, Novel Patterning Technologies | |
imec.availability | Published - imec | |