Publication:

Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications

Date

2021

Proceedings Paper

https://doi.org/10.1109/ESSDERC53440.2021.9631811

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Author(s)

;

Belmonte, Attilio

;

Perumkunnil, Manu

;

;

Rassoul, Nouredine

;

Donadio, Gabriele Luca

;

Delhougne, Romain

;

Furnemont, Arnaud

;

Kar, Gouri Sankar

;

Journal

na

Metrics

1117 since deposited on 2023-06-20

Acq. date: 2025-12-18