Publication:
Time Evolution of DIBL in Gate-All-Around Nanowire MOSFETs During Hot-Carrier Stress
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1110 since deposited on 2023-06-20
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Acq. date: 2026-09-19
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Statistics
Views
1110 since deposited on 2023-06-20
1last month
1last week
Acq. date: 2026-09-19
Citations