Experimental Validation of Process-Induced Variability Aware SPICE Simulation Platform for Sub-20 nm FinFET Technologies

Publication:

2021

Journal article

Author(s)

;

;

;

;

;

;

;

IEEE TRANSACTIONS ON ELECTRON DEVICES

1174 since deposited on 2023-06-20

2last month

Acq. date: 2026-08-07