| dc.contributor.author | Vinnakota, Bapi | |
| dc.contributor.author | Derakhshandeh, Jaber | |
| dc.contributor.author | Beyne, Eric | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Chakravarty, Sreejit | |
| dc.date.accessioned | 2023-08-11T07:19:18Z | |
| dc.date.available | 2023-07-24T17:10:22Z | |
| dc.date.available | 2023-07-26T14:56:13Z | |
| dc.date.available | 2023-08-11T07:19:18Z | |
| dc.date.issued | 2023 | |
| dc.identifier.issn | 1093-0167 | |
| dc.identifier.other | WOS:001011806600038 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42187.3 | |
| dc.source | WOS | |
| dc.title | IP Session on Chiplet: Design, Assembly, and Test | |
| dc.type | Proceedings paper | |
| dc.contributor.imecauthor | Derakhshandeh, Jaber | |
| dc.contributor.imecauthor | Beyne, Eric | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Derakhshandeh, Jaber::0000-0003-2448-9165 | |
| dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.embargo | 9999-12-31 | |
| dc.identifier.doi | 10.1109/VTS56346.2023.10140103 | |
| dc.identifier.eisbn | 979-8-3503-4630-5 | |
| dc.source.numberofpages | 1 | |
| dc.source.peerreview | yes | |
| dc.source.conference | 41st IEEE VLSI Test Symposium (VTS) | |
| dc.source.conferencedate | APR 24-26, 2023 | |
| dc.source.conferencelocation | San Diego | |
| dc.source.journal | IEEE VLSI Test Symposium | |
| imec.availability | Published - imec | |
