IP Session on Chiplet: Design, Assembly, and Test

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Authors
Vinnakota, Bapi; Derakhshandeh, Jaber; Beyne, Eric; Marinissen, Erik Jan; Chakravarty, Sreejit
DOI
10.1109/VTS56346.2023.10140103
EISBN
979-8-3503-4630-5
ISSN
1093-0167
Conference
41st IEEE VLSI Test Symposium (VTS)
Journal
IEEE VLSI Test Symposium
Title
IP Session on Chiplet: Design, Assembly, and Test
Publication type
Proceedings paper
Embargo date
9999-12-31
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320.500.12860/42187.3*2023-08-11T07:18:07Zvalidation by library/open access desk
220.500.12860/42187.22023-07-26T14:53:09Zvalidation by imec author
120.500.12860/421872023-07-24T17:10:22Z

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