dc.contributor.author | Tierno, Davide | |
dc.contributor.author | Ciofi, Ivan | |
dc.contributor.author | Parvais, Bertrand | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Varela Pedreira, Olalla | |
dc.date.accessioned | 2023-08-09T12:36:58Z | |
dc.date.available | 2023-08-07T17:07:26Z | |
dc.date.available | 2023-08-08T13:28:38Z | |
dc.date.available | 2023-08-09T12:36:58Z | |
dc.date.issued | 2023 | |
dc.identifier.issn | 2380-632X | |
dc.identifier.other | WOS:001027381700019 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/42295.3 | |
dc.source | WOS | |
dc.title | Exploring the Benefits of Cryogenic Temperatures for Co and Ru Metallizations | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Tierno, Davide | |
dc.contributor.imecauthor | Ciofi, Ivan | |
dc.contributor.imecauthor | Parvais, Bertrand | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Varela Pedreira, Olalla | |
dc.contributor.orcidimec | Tierno, Davide::0000-0003-4915-904X | |
dc.contributor.orcidimec | Ciofi, Ivan::0000-0003-1374-4116 | |
dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Varela Pedreira, Olalla::0000-0002-2987-1972 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1109/IITC/MAM57687.2023.10154717 | |
dc.identifier.eisbn | 979-8-3503-1097-9 | |
dc.source.numberofpages | 3 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Interconnect Technology Conference (IITC) / IEEE Materials for Advanced Metallization Conference (MAM) | |
dc.source.conferencedate | MAY 22-25, 2023 | |
dc.source.conferencelocation | Dresden | |
dc.source.journal | IEEE International Conference on Interconnect Technology | |
imec.availability | Published - imec | |