Publication:

Device-Aware Test for Back-Hopping Defects in STT-MRAMs

Date

2023

Proceedings Paper

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Author(s)

;

Taouil, Mottaqiallah

;

Fieback, Moritz

;

;

Marinissen, Erik Jan

;

Kar, Gouri Sankar

;

;

Couet, Sebastien

;

Journal

N/A

Statistics

857 since deposited on 2023-08-19

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Acq. date: 2026-08-08