Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

Zenari, Michele; Buffolo, Matteo; De Santi, Carlo; Goyvaerts, Jeroen; Grabowski, Alexander; Gustavsson, Johan; Baets, Roel; Larsson, Anders; Roelkens, Gunther; Meneghesso, Gaudenzio; Zanoni, Enrico; Meneghini, Matteo

doi:10.1109/TED.2023.3346370

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Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

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2024

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https://doi.org/10.1109/TED.2023.3346370

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Meneghesso, Gaudenzio

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Zanoni, Enrico

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Meneghini, Matteo

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IEEE TRANSACTIONS ON ELECTRON DEVICES

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99 since deposited on 2024-01-24

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Acq. date: 2025-12-12

663 since deposited on 2024-01-24

Acq. date: 2025-12-12

Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

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