Publication:

Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics

Date

2024
Journal article
https://doi.org/10.1109/TED.2023.3346370
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 3.16 MB

Author(s)

Zenari, Michele
;
Buffolo, Matteo
;
De Santi, Carlo
;
Goyvaerts, Jeroen
;
Grabowski, Alexander
;
Gustavsson, Johan
;
Baets, Roel  
;
Larsson, Anders
;
Roelkens, Gunther  
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
;
Meneghini, Matteo

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Abstract

Description

Statistics

Downloads

162 since deposited on 2024-01-24
8last month
Acq. date: 2026-05-31

Views

666 since deposited on 2024-01-24
Acq. date: 2026-05-29

Citations

Statistics

Downloads

162 since deposited on 2024-01-24
8last month
Acq. date: 2026-05-31

Views

666 since deposited on 2024-01-24
Acq. date: 2026-05-29

Citations