Publication:
Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis
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197 since deposited on 2024-02-06
29last month
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Acq. date: 2026-01-09
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493 since deposited on 2024-02-06
5last month
3last week
Acq. date: 2026-01-09
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