Publication:

Characterization and Advanced Modeling of Dielectric Defects in Low-Thermal Budget RMG MOSFETs Using 1/f Noise Analysis

Date

2024
Journal article
https://doi.org/10.1109/ted.2024.3351598
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

Published version 5.1 MB

Author(s)

Asanovski, R.
;
Arimura, Hiroaki  
;
de Marneffe, Jean-Francois  
;
Palestri, P.
;
Horiguchi, Naoto  
;
Kaczer, Ben  
;
Selmi, L.
;
Franco, Jacopo  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Abstract

Description

Statistics

Downloads

298 since deposited on 2024-02-06
16last month
13last week
Acq. date: 2026-07-18

Views

503 since deposited on 2024-02-06
Acq. date: 2026-07-18

Citations

Statistics

Downloads

298 since deposited on 2024-02-06
16last month
13last week
Acq. date: 2026-07-18

Views

503 since deposited on 2024-02-06
Acq. date: 2026-07-18

Citations