Publication:
Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy Measurements
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584 since deposited on 2024-04-07
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Acq. date: 2026-08-07
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Statistics
Views
584 since deposited on 2024-04-07
5last month
Acq. date: 2026-08-07
Citations