Publication:
Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy Measurements
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574 since deposited on 2024-04-07
3last month
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Acq. date: 2026-01-09
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Views
574 since deposited on 2024-04-07
3last month
1last week
Acq. date: 2026-01-09
Citations