Publication:
Soft X-ray reflectometry for the inspection of interlayer roughness in stacked thin film structures
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Acq. date: 2026-01-09
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648 since deposited on 2024-06-15
Acq. date: 2026-01-09
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249 since deposited on 2024-06-15
31last month
7last week
Acq. date: 2026-01-09
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648 since deposited on 2024-06-15
Acq. date: 2026-01-09
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