Publication:
Soft X-ray reflectometry for the inspection of interlayer roughness in stacked thin film structures
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Acq. date: 2026-01-08
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648 since deposited on 2024-06-15
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247 since deposited on 2024-06-15
29last month
6last week
Acq. date: 2026-01-08
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648 since deposited on 2024-06-15
Acq. date: 2026-01-08
Citations