Publication:
Properties of NbxTi(1-x)N thin films deposited on 300 mm silicon wafers for upscaling superconducting digital circuits
Loading...
Journal
Abstract
Description
Statistics
Views
118 since deposited on 2024-06-25
2last month
1last week
Acq. date: 2026-02-25
Citations
Statistics
Views
118 since deposited on 2024-06-25
2last month
1last week
Acq. date: 2026-02-25
Citations