Publication:
Toward Understanding the Failure Mechanism in p-GaN Gate HEMTs Operating in Reverse Conduction Diode Mode
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637 since deposited on 2024-07-04
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Acq. date: 2026-05-17
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Statistics
Views
637 since deposited on 2024-07-04
2last month
1last week
Acq. date: 2026-05-17
Citations