Publication:

A novel test and analysis scheme to elucidate tail bit characteristics in STT-MRAM arrays

Date

2024

Proceedings Paper

https://doi.org/10.1109/imw59701.2024.10536950

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Author(s)

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Couet, Sebastien

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Journal

N/A

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598 since deposited on 2024-07-12

2last month

Acq. date: 2026-08-08