Publication:

Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs

Date

2024
Journal article
https://doi.org/10.1038/s41699-024-00482-9
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Author(s)

Panarella, Luca  
;
Kaczer, Ben  
;
Smets, Quentin  
;
Tyaginov, Stanislav  
;
Saraza Canflanca, Pablo  
;
Vici, Andrea  
;
Verreck, Devin  
;
Schram, Tom  
;
Lin, Dennis  
;
Knobloch, Theresia
;
Grasser, Tibor
;
Lockhart de la Rosa, Cesar Javier  
;
Kar, Gouri Sankar  
;
Afanasiev, Valeri  

Journal

NPJ 2D MATERIALS AND APPLICATIONS

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