Authors

Henson, Kirklen; Yang, N.; Kubicek, Stefan; Vogel, E. M.; Wortman, J.; De Meyer, Kristin; Naem, Abdalla

Issue

7

Journal

IEEE Trans. Electron Devices

Volume

47

Title

Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime

Publication type

Journal article

Embargo date

9999-12-31