Publication:
Electrical Stability of MOS Structures With AlON and Al2O3 Dielectrics Deposited on n-and p-Type GaN
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641 since deposited on 2024-08-05
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Acq. date: 2026-01-09
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641 since deposited on 2024-08-05
1last month
1last week
Acq. date: 2026-01-09
Citations