Publication:

Electrical Stability of MOS Structures With AlON and Al2O3 Dielectrics Deposited on n-and p-Type GaN

Date

2024

Journal article

https://doi.org/10.1109/TED.2024.3422950

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Author(s)

Filho Goncalez, Walter

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Chatterjee, Urmimala

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Decoutere, Stefaan

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Knaepen, Werner

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Arnou, Panagiota

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Bakeroot, Benoit

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

Metrics

640 since deposited on 2024-08-05

2last month

Acq. date: 2025-12-15