Publication:
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
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693 since deposited on 2024-08-07
2last month
Acq. date: 2026-01-11
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Views
693 since deposited on 2024-08-07
2last month
Acq. date: 2026-01-11
Citations