Publication:
Statistical characterization of off-state stress degradation in planar HKMG nFETs using device arrays
Loading...
Journal
Abstract
Description
Statistics
Views
429 since deposited on 2024-08-16
2last month
Acq. date: 2026-02-24
Citations
Statistics
Views
429 since deposited on 2024-08-16
2last month
Acq. date: 2026-02-24
Citations