Publication:

DC Reliability study of high-k GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers

Date

2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529379
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Author(s)

O'Sullivan, Barry  
;
Alian, AliReza  
;
Sibaja-Hernandez, Arturo  
;
Franco, Jacopo  
;
Yadav, Sachin  
;
Yu, Hao  
;
Rathi, Aarti  
;
Peralagu, Uthayasankaran  
;
Vaisman Chasin, Adrian  
;
Parvais, Bertrand  
;
Collaert, Nadine  

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