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DC Reliability study of high-k GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers
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DC Reliability study of high-k GaN-on-Si MOS-HEMT's for mm-Wave Power Amplifiers
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Date
2024
Proceedings Paper
https://doi.org/10.1109/IRPS48228.2024.10529379
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
O'Sullivan, Barry
;
Alian, AliReza
;
Sibaja-Hernandez, Arturo
;
Franco, Jacopo
;
Yadav, Sachin
;
Yu, Hao
;
Rathi, Aarti
;
Peralagu, Uthayasankaran
;
Vaisman Chasin, Adrian
;
Parvais, Bertrand
;
Collaert, Nadine
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425
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Acq. date: 2026-01-09
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Metrics
Views
425
since deposited on 2024-08-16
2
last month
Acq. date: 2026-01-09
Citations