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Transmission electron microscopy investigation of the crystallographic quality of silicon films grown epitaxially on porous silicon
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Authors
Jin, S.
;
Bender, Hugo
;
Stalmans, Lieven
;
Bilyalov, Renat
;
Poortmans, Jef
;
Loo, Roger
;
Caymax, Matty
Issue
1_2
Journal
Journal of Crystal Growth
Volume
212
Title
Transmission electron microscopy investigation of the crystallographic quality of silicon films grown epitaxially on porous silicon
Publication type
Journal article
Embargo date
9999-12-31
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