Publication:

P-GaN Gate HEMTs: A Solution to Improve the High-Temperature Gate Lifetime

Date

2024

Journal article

https://doi.org/10.1109/LED.2024.3424563

Simple item page Full metadata Statistics

Author(s)

Tallarico, A. N.

;

;

;

Bakeroot, Benoit

;

Posthuma, Niels

;

;

Decoutere, Stefaan

;

;

Journal

IEEE ELECTRON DEVICE LETTERS

Statistics

525 since deposited on 2024-09-29

2last month

Acq. date: 2026-03-17