Publication:
Investigation of defect states in AlGaN/GaN high electron mobility transistors by small-signal admittance analysis
Loading...
Journal
Abstract
Description
Statistics
Downloads
145 since deposited on 2024-11-02
27last month
6last week
Acq. date: 2026-02-28
Views
102 since deposited on 2024-11-02
Acq. date: 2026-02-28
Citations
Statistics
Downloads
145 since deposited on 2024-11-02
27last month
6last week
Acq. date: 2026-02-28
Views
102 since deposited on 2024-11-02
Acq. date: 2026-02-28
Citations