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Investigation of defect states in AlGaN/GaN high electron mobility transistors by small-signal admittance analysis

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97 since deposited on 2024-11-02
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Acq. date: 2026-01-07

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102 since deposited on 2024-11-02
Acq. date: 2026-01-07

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97 since deposited on 2024-11-02
21last month
5last week
Acq. date: 2026-01-07

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102 since deposited on 2024-11-02
Acq. date: 2026-01-07

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