Publication:
Investigation of defect states in AlGaN/GaN high electron mobility transistors by small-signal admittance analysis
Loading...
Journal
Abstract
Description
Statistics
Downloads
211 since deposited on 2024-11-02
43last month
7last week
Acq. date: 2026-04-27
Views
103 since deposited on 2024-11-02
1last month
Acq. date: 2026-04-27
Citations
Statistics
Downloads
211 since deposited on 2024-11-02
43last month
7last week
Acq. date: 2026-04-27
Views
103 since deposited on 2024-11-02
1last month
Acq. date: 2026-04-27
Citations