Publication:
Interface sharpness in stacked thin film structures: a comparison of soft X-ray reflectometry and transmission electron microscopy
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125 since deposited on 2025-01-09
34last month
6last week
Acq. date: 2026-01-09
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137 since deposited on 2025-01-09
1last month
Acq. date: 2026-01-09
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