Publication:
Measurement of hole transport in ultrathin SiGe layers and their application in 2D device simulations of heterojunction pMOSFETs
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1898 since deposited on 2021-10-14
1last month
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Acq. date: 2026-01-11
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Views
1898 since deposited on 2021-10-14
1last month
1last week
Acq. date: 2026-01-11
Citations