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Reliability of high-performance monolayer MoS<sub>2</sub> transistors on scaled high-κ HfO<sub>2</sub>
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Reliability of high-performance monolayer MoS<sub>2</sub> transistors on scaled high-κ HfO<sub>2</sub>
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Date
2025-JAN 24
Journal article
https://doi.org/10.1038/s41699-025-00527-7
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lan, Hao-Yu
;
Yang, Shao-Heng
;
Kantre, Karim-Alexandros
;
Cott, Daire
;
Tripathi, Rahul
;
Appenzeller, Joerg
;
Chen, Zhihong
Journal
NPJ 2D MATERIALS AND APPLICATIONS
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236
since deposited on 2025-02-02
Acq. date: 2025-12-24
Citations
Metrics
Views
236
since deposited on 2025-02-02
Acq. date: 2025-12-24
Citations