Publication:

Understanding the Slow Erase Operation in IGZO-Channel FeFETs: The Role of Positive Charge Generation Kinetics

Date

2025

Journal article

https://doi.org/10.1109/JEDS.2025.3541418

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Author(s)

;

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Izmailov, Roman

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;

Popovici, Mihaela Ioana

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Dekkers, Harold

;

Pavel, Alexandru

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Bosch, Geert Van den

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Rosmeulen, Maarten

;

Afanas'Ev, Valeri V.

;

Journal

IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY

Metrics

157 since deposited on 2025-03-31

Acq. date: 2025-12-25