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A high-performance drying method enabling clustered single wafer wet cleaning
Publication:
A high-performance drying method enabling clustered single wafer wet cleaning
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Date
2000
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mertens, Paul
;
Doumen, Geert
;
Lauerhaas, Jeff
;
Kenis, Karine
;
Fyen, Wim
;
Meuris, Marc
;
Arnauts, Sophia
;
Devriendt, Katia
;
Vos, Rita
;
Heyns, Marc
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Acq. date: 2026-02-27
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Views
2045
since deposited on 2021-10-14
1
last month
Acq. date: 2026-02-27
Citations