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Energy band alignment in MoS<sub>2</sub>/HfO<sub>2</sub>: Transfer-related artifacts and interfacial effects
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Energy band alignment in MoS<sub>2</sub>/HfO<sub>2</sub>: Transfer-related artifacts and interfacial effects
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Date
2025-JUN 28
Journal article
https://doi.org/10.1063/5.0279067
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Shlyakhov, I.
;
Iakoubovskii, K.
;
Lin, D.
;
Asselberghs, I.
;
Gaur, A.
;
Delie, G.
;
Afanas'ev, V.
Journal
JOURNAL OF APPLIED PHYSICS
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58
since deposited on 2025-07-08
3
last month
Acq. date: 2026-01-07
Citations