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Nanofabrication of sharp conductive diamond tip probe chips and their application in reverse tip sample scanning probe microscopy
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Nanofabrication of sharp conductive diamond tip probe chips and their application in reverse tip sample scanning probe microscopy
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Date
2025-SEP
Journal article
https://doi.org/10.1016/j.mne.2025.100307
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wouters, L.
;
Cho, J.
;
Gim, S.
;
Yang, J.
;
Kanniainen, A.
;
Lee, K.
;
Lagrain, P.
;
Peric, N.
;
Hantschel, T.
Journal
MICRO AND NANO ENGINEERING
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46
since deposited on 2025-07-18
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last month
Acq. date: 2026-01-09
Citations
Metrics
Views
46
since deposited on 2025-07-18
2
last month
Acq. date: 2026-01-09
Citations