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Innovative design solutions for avoiding at-resolution field stitching in high-NA EUV lithography
Publication:
Innovative design solutions for avoiding at-resolution field stitching in high-NA EUV lithography
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Date
2025
Proceedings Paper
https://doi.org/10.1117/12.3051547
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Miyaguchi, Kenichi
;
Kim, Ryoung-Han
;
Oak, Apoorva
;
Drissi, Youssef
;
Chang, Chieh-Miao
;
Lee, Jeonghoon
;
Sherazi, Yasser
;
Trivkovic, Darko
;
Liu, Ru-Gun
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35
since deposited on 2025-07-31
Acq. date: 2026-01-09
Citations
Metrics
Views
35
since deposited on 2025-07-31
Acq. date: 2026-01-09
Citations