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Moore's Law meets High-NA EUV: Random via patterning for next-generation nodes
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Moore's Law meets High-NA EUV: Random via patterning for next-generation nodes
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Date
2025
Proceedings Paper
https://doi.org/10.1117/12.3050453
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chowrira, B.
;
Carballo, V. M. Blanco
;
Dusa, M.
;
Tan, L. E.
;
Vats, H.
;
Gillijns, W.
;
Decoster, S.
;
Niroomand, A.
;
Rutigliani, V. D.
;
Halder, S.
;
Sangghaleh, M.
;
Tyagi, D.
;
Kamali, A.
;
Newman, M.
;
Demand, M.
;
Wako, Y.
;
Negreira, A.
;
Clark, R.
;
Nafus, K.
;
O'Toole, M.
;
Hsia, J.
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42
since deposited on 2025-07-31
Acq. date: 2026-01-10
Citations
Metrics
Views
42
since deposited on 2025-07-31
Acq. date: 2026-01-10
Citations